This patent had ► Log In grant time compared to others in this category.
Patent grant time can be influenced by many factors. Activities within the USPTO that are beyond the control of patent attornies can influence grant time, but short grant times can also indicate well-written patents and dedicated efforts to respond rapidly to USPTO office actions with strong arguments. Shorter grant times are preferable, and the scores for this section are inverse measures — higher scores are better.
This patent has ► Log In claims compared to others in this category.
The number of claims in a patent is correlated with its strength. Because greater claim counts increase the cost of a patent, more claims can indicate the importance an applicant assigns to a patent. Importantly, some may elect to file claims across multiple patents. A higher score in this metric indicates more claims, relative to others in this category.
This patent has received ► Log In citations from other patents, than others in this category.
Citations from other patents are an important measure of the significance of a patent. More citations indicate that other technologies build on a patent. Higher scores in this metric are better, and indicate more citations from other patents.
This patent referenced ► Log In citations to other patents, than others in this category.
A lower number of citations to other patents can be a sign of diminished patent strength. More citations indicate dependence on more other technologies. Higher scores in this category are better, and indicate fewer citations to other patents.
This patent has ► Log In proximity to basic research compared to others in this category.
Proximity to basic research is measured by comparing the number of citations to non-patent literature among a cohort of patents. Because most non-patent citations are primary research papers, a higher count indicates greater proximity to basic research.
|6,539,531||Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes|
|6,448,865||Integrated circuit interconnect system|
|6,312,980||Programmable triangular shaped device having variable gain|
|6,150,724||Multi-chip semiconductor device and method for making the device by using multiple flip chip interfaces|
|8,589,857||PWB voltage and/or current calculation and verification|
|8,572,004||Space solution search|
|8,453,081||Electrical design space exploration|
|8,451,017||Membrane probing method using improved contact|
|8,410,806||Replaceable coupon for a probing apparatus|
|8,171,435||Integrated circuit structure incorporating an inductor, an associated design method and an associated design system|
|8,161,451||PWB voltage and/or current calculation and verification|
|8,013,623||Double sided probing structures|
|7,940,069||System for testing semiconductors|
|7,898,281||Interface for testing semiconductors|
|7,898,273||Probe for testing a device under test|
|7,893,704||Membrane probing structure with laterally scrubbing contacts|
|7,888,957||Probing apparatus with impedance optimized interface|
|7,876,114||Differential waveguide probe|
|7,764,072||Differential signal probing system|
|7,761,986||Membrane probing method using improved contact|
|7,761,983||Method of assembling a wafer probe|
|7,759,953||Active wafer probe|
|7,750,652||Test structure and probe for differential signals|
|7,723,999||Calibration structures for differential signal probing|
|7,681,312||Membrane probing system|
|7,656,172||System for testing semiconductors|
|7,619,419||Wideband active-passive differential signal probe|
|7,609,077||Differential signal probe with integral balun|
|7,541,821||Membrane probing system with local contact scrub|
|7,535,247||Interface for testing semiconductors|
|7,533,462||Method of constructing a membrane probe|
|7,518,387||Shielded probe for testing a device under test|
|7,514,944||Probe head having a membrane suspended probe|
|7,504,842||Probe holder for testing of a test device|
|7,501,842||Shielded probe for testing a device under test|
|7,498,829||Shielded probe for testing a device under test|
|7,492,175||Membrane probing system|
|7,489,149||Shielded probe for testing a device under test|
|7,482,823||Shielded probe for testing a device under test|
|7,453,276||Probe for combined signals|
|7,449,899||Probe for high frequency signals|
|7,443,186||On-wafer test structures for differential signals|
|7,436,194||Shielded probe with low contact resistance for testing a device under test|
|7,427,868||Active wafer probe|
|7,420,381||Double sided probing structures|
|7,417,446||Probe for combined signals|
|7,403,028||Test structure and probe for differential signals|
|7,403,025||Membrane probing system|
|7,400,155||Membrane probing system|
|7,368,927||Probe head having a membrane suspended probe|
|7,355,420||Membrane probing system|
|7,304,488||Shielded probe for high-frequency testing of a device under test|
|7,285,969||Probe for combined signals|
|7,271,603||Shielded probe for testing a device under test|
|7,266,889||Membrane probing system|
|7,257,796||Method of incorporating interconnect systems into an integrated circuit process flow|
|7,249,337||Method for optimizing high frequency performance of via structures|
|7,210,114||Redistribution metal for output driver slew rate control|
|7,205,784||Probe for combined signals|
|7,178,236||Method for constructing a membrane probe using a depression|
|7,161,363||Probe for testing a device under test|
|7,148,714||POGO probe card for low current measurements|
|7,148,711||Membrane probing system|
|7,109,731||Membrane probing system with local contact scrub|
|7,107,555||Method and apparatus for designing high-frequency circuit, and display method for use in designing high-frequency circuit|
|7,082,585||Analysis of integrated circuits for high frequency performance|
|7,075,320||Probe for combined signals|
|7,071,718||Low-current probe card|
|7,068,057||Low-current pogo probe card|
|7,057,404||Shielded probe for testing a device under test|
|7,042,241||Low-current pogo probe card|
|6,978,431||Automatic placement and routing apparatus automatically inserting a capacitive cell|